Oryema, B., Madiba, I. G., & Mtshali, C. B. (2024). Atomistic Simulation of Primary Radiation Damage Profiles in Fluorine-Doped Tin Oxide Thin Film Target Using SRIM Code. Nano-Horizons: Journal of Nanosciences and Nanotechnologies, 3, 23 pages. https://doi.org/10.25159/3005-2602/15610