ORYEMA, Bosco; MADIBA, Itani G.; MTSHALI, Christopher B. Atomistic Simulation of Primary Radiation Damage Profiles in Fluorine-Doped Tin Oxide Thin Film Target Using SRIM Code. Nano-Horizons: Journal of Nanosciences and Nanotechnologies, [S. l.], v. 3, p. 23 pages, 2024. DOI: 10.25159/3005-2602/15610. Disponível em: https://unisapressjournals.co.za/index.php/NH/article/view/15610. Acesso em: 13 nov. 2025.