Oryema, Bosco, Itani G. Madiba, and Christopher B. Mtshali. 2024. “Atomistic Simulation of Primary Radiation Damage Profiles in Fluorine-Doped Tin Oxide Thin Film Target Using SRIM Code”. Nano-Horizons: Journal of Nanosciences and Nanotechnologies 3 (November):23 pages. https://doi.org/10.25159/3005-2602/15610.